Full Quasi-Peak Characterization in Real-time

The TDEMI X Measurement System allows for a full quasi-peak characterization of a Device Under Test (DUT) in real-time, measuring all frequencies and positions up to 1 GHz. This significantly improves the overall quality of testing and reduces measurement uncertainty by orders of magnitude, as it performs measurements with a quasi-peak detector at up to 64,000 frequencies in parallel. The system also enables the measurement and visualization of radiation patterns in 2D and 3D images to identify radiating sources, and test reports can be generated fully automated.