Test Hat for X-Band Antennas
The Anywaves Test Hat for X-Band Antennas is a ground support equipment (GSE) tool for performing end-to-end RF testing of Anywaves X-Band payload downlink antennas directly on the satellite platform.
Key figurescomparable across the catalogue
- Mass
- 0.615 kg
- Largest dimension
- 106.2 mm
Normalised to common units so this product can be compared with others in its category. The supplier's own wording is below.
As published by the supplier
- Frequency band
- 7.9 GHz to 8.5 GHz
- Coupling factor
- > 31 dB between 7.9 and 8.5 GHz
- Envelope size without connector
- 100.2 × 100.2 × 106.2 mm
- Mass with connector
- 615 g (±5%)
- Qualification temperature
- −40°C to +85°C (TVAC compatible)
About
The Test Hat for X-Band Antennas is designed to fit exactly the 100 × 100 mm panel footprint shared by Anywaves X-Band antennas, including the Compact X-Band Antenna, Wide Beam X-Band Antenna, Compact X-Band Dual-Polarized Antenna, and High Gain X-Band Antenna. It comes with 4 × M3 captive screws for direct attachment to the antenna’s unthreaded holes, ensuring correct and repeatable positioning. This test hat is TVAC compatible, qualified for thermal vacuum environments from −40°C to +85°C, with low outgassing properties, making it safe for use inside a TVAC chamber. Its higher upper temperature limit of +85°C accommodates demanding thermal environments for X-Band payload downlink antennas. The Test Hat is compatible with both Left Hand and Right Hand Circular Polarization, covering the entire Anywaves X-Band payload downlink antenna family, simplifying procurement and inventory management. It enables complete end-to-end RF testing of the X-Band payload downlink antenna and transmitter chain directly on the satellite platform, from assembly bench to final TVAC testing, eliminating the need for anechoic chamber measurements during integration.
Documentation
Need the full ICD, test reports or a specific revision? Ask the supplier directly.