HARDWARE / PRODUCTAdded 2 Jul 2026

SNIFT

TICRA
SNIFT

Accurate and highly stable transformation of measured spherical near-field antenna data to far fields, accounting for the full characteristics of the measuring probe.

Technical specifications

Feature
Allows full sphere or partial sphere input data
Feature (2)
Full correction for axially symmetric (m=±1) probes
Feature (3)
Fast Fourier Transformation and self-stabilising recurrence relations allow handling of even very large antenna structures
Feature (4)
Industry standard for spherical near-field to far-field transformation with probe correction
Feature (5)
Independent of the actual measurement system implementation
Benefit
Short transformation time
Benefit (2)
Mathematically exact pattern transformation
Benefit (peak)
Output coordinate system may be rotated to coincide with the peak direction of the far field
Benefit (max)
Non-Maxwellian measurement inaccuracies are averaged to physically correct output
Benefit (5)
Noise reduction by means of high-order spherical mode filtering

About

SNIFT is the industry standard for spherical near-field to far-field transformation with probe correction, independent of the actual measurement system implementation. If only a certain region of the antenna pattern is of interest, truncated measurements can still be transformed with SNIFT; the supplementary program ROSCOE can then perform coordinate transformation into a system centered around the peak when the region of interest doesn’t coincide with the measurement coordinate axes. A well-founded choice of numerical implementation ensures a very stable algorithm, even for high-order harmonics — antennas with diameters exceeding several hundred wavelengths are handled within seconds on a standard PC with accurate determination of all involved spherical harmonics.

Documentation

No public datasheet yet — request the datasheet / ICD from the supplier.

Source: www.ticra.com ↗

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