End-of-Line Tester UTP 6010 RF
NOFFZ Technologies
Compact low-channel-count RF functional and end-of-line test system for automotive and IoT modules.
Technical specifications
- Test type
- RF functional test, end-of-line / board-level (FKT/EOL)
- DUT capacity
- Single DUT (Single Device Under Test)
- Typical DUTs
- eCall modules, NAD modules, connected gateways, TCUs, IAMs
- RF chamber
- Integrated NOFFZ RF chamber UTP 5070
- Automation
- Manual or robot-operated adapter
- Standard equipment
- Integrated power distribution unit (PDU), keyboard drawer, swivel monitor
- Integrated instrumentation
- A2B and RF signal testing via ITD 1024 / Universal Wireless Tester (UWT)
About
The UTP 6010 is one of NOFFZ’s smallest test systems and a cost-effective entry point into the UTP tester family. This fast system realizes scalable functional test applications for a single device under test (DUT) with multiple RF channels and mixed-signal test capability. Depending on the adapter, the DUT can be tested at board level (functional test) or in its installed state at end-of-line. Channel count and interface complexity are configured to customer requirements. Its compact form factor makes it especially suited for functional tests with low channel count and complexity, including vision and audio tests, and it can be expanded to medium/large channel counts via the UTP 9010. Typical DUTs include eCall modules, NAD modules, connected gateways, telematics control units (TCU), and intelligent antenna modules (IAM). Shielded wireless-standard testing is enabled via the integrated NOFFZ RF chamber UTP 5070, either wired or over-the-air, and the adapter can be operated manually or by a collaborating robot arm.
Documentation
No public datasheet yet — request the datasheet / ICD from the supplier.
