Multi-DUT Burn-In / Screening Tester UTP 9065
NOFFZ Technologies
Highly parallel, scalable UTP test system for long-term functional testing, environmental screening, and burn-in of electronic assemblies.
Technical specifications
- Test type
- Multi-DUT burn-in, screening, long-term functional test
- Environmental range
- Approx. -40 degC to +85 degC in climate chamber
- Parallelization
- Multiple DUTs tested simultaneously (example configs up to 8 DUTs parallel)
- Software
- UTP Software Suite (sequencing, variant management, data logging, MES/IT connectivity)
- Example configuration
- Two drawers with 28 modules, flexible interfaces, RF tests, PXI-based automation
- Industries
- Automotive, e-mobility, industrial electronics, telecommunications
About
The UTP 9065 is a scalable, highly parallel test system within the NOFFZ Universal Tester Platform (UTP), optimized for long-term functional tests, environmental screening, and burn-in processes across a wide range of electronic assemblies. Its highly modular design enables efficient validation of multiple DUTs under identical, reproducible test conditions. It supports simultaneous testing of many DUTs for significantly higher throughput in burn-in, screening, and endurance testing, and is designed to operate inside climate chambers across an extended temperature range (approx. -40 degC to +85 degC) for thermal cycling and stress testing. Flexible fixture concepts and adaptable interfaces allow quick changeover between product variants. The UTP software suite provides fully automated test execution, comprehensive logging, and connectivity to customer databases or production IT systems. Typical applications include long-term functional tests, thermal stress/endurance tests, screening of safety- or communication-relevant modules, multi-DUT validation in development or pre-series phases, and high-throughput testing of ECUs, power electronics, or sensor-based assemblies.
Documentation
No public datasheet yet — request the datasheet / ICD from the supplier.
