Scan Mirror Test
Data Patterns (India) Ltd.The Scan Mirror Test system is used for validating the linearity of the Scan Mirror Mechanism that is…
11 satellite platforms, components and ground equipment from manufacturers worldwide.
The Scan Mirror Test system is used for validating the linearity of the Scan Mirror Mechanism that is…
The Redundant Strap Down Inertial Navigation System (RESINS) checkout test station is a cPCI chassis with various functional…
The Instrument Test Unit For Advanced Inertial Sensors (INTU) is designed for testing and evaluating Ring Laser Gyros…
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns, featuring a…
A comprehensive test system designed to test redundant architectures of Bus Management Units, performing tests of over 3000…
Data Patterns has built high reliability Cable Harness Test Systems for large installations, primarily used in launch vehicle,…
The Generic RF ATE is developed to test Radar and Radar Subsystems, primarily built using instrumentation control, precision…
The Power Module Checkout ATE is developed for testing DC-DC Power modules typically utilized in India's space program.
Data Patterns develops Automated Test Equipment (ATE) for critical aerospace and space requirements, including test benches for launch…
Automated Test Equipment product line built for validating spacecraft, launch vehicle and missile subsystems.
VXI-based redundant launch pad countdown automation system handling up to 14,000 I/O points, in operation since 2001.
These are saved in this browser only. Sign in and they move to your account, where they stay across devices.
We use cookies. Strictly necessary cookies keep the platform working. With your consent we also use Google Analytics to understand how the platform is used and improve it. We do not use advertising cookies. Cookie Policy · Privacy
How is your experience with the platform? Your message goes straight to our team.
Thank you! Your feedback has been sent to our team.